Abstract
In the past decade, polymers and small molecule thin films have found use in organic electronics as organic FETs (OFETS), photovoltaics (OPV) and LEDs (OLEDS). The way the organic molecules pack and the nanoscale morphology of these films (which is often different than in bulk) have a strong impact on the film functionality. To determine this structure and relate this to the film functionality, we have used grazing-incidence X-ray diffraction (GIXD) and small X-ray angle scattering (SAXS). This talk will describe this characterization of organic electronic thin films with a focus on gaining quantitative knowledge of the film structure and morphology [1-4] and relating this to performance.
Biography
Michael Toney is head of the Materials Sciences Division and a distinguished staff scientist at the Stanford Synchrotron Radiation Lightsource (SSRL), part of the SLAC National Accelerator Laboratory. He is a pioneer in the use of X-ray diffraction and small angle scattering for the determination of molecular and mesoscale structure of organic thin films and for the determination of atomic structure of electrode-electrolyte interfaces. He is a Thomson Reuters highly cited researchers in Materials Sciences.
After his PhD in surface physics and a postdoc conducting some of the first surface X-ray diffraction experiments, Toney began working at IBM Almaden Research. He left IBM in 2003 to join SLAC National Accelerator Laboratory and Stanford, where he starting programs in sustainable energy materials.