Tim Cheng

Electrical & Computer Engineering


4109 Harold Frank Hall, 3227 Cheadle Hall

University of California, Santa Barbara Santa Barbara, CA 93106-5080

IEE Research Areas: 


Greenscale Center for Energy-Efficient Computing


2000 IEEE Fellow
1987 AT&T Conference on Electronic Testing Best Paper
1994, 1999 Design Automation Conferences Best Paper
2003 Conference of Design Automation and Test Best Paper
2007 IEEE Asian Test Symposium Best Paper
2008 IEEE VLSI Test Symposium Best Paper
2001 Journal of Information Science and Engineering Best Paper 
2004-2005 UCSB College of Engineering Outstanding Teaching Faculty

Research Description: 

Tim Cheng’s current research interests include design validation, verification, testing and multimedia computing. He manages two research labs: SoC Design and Test Lab and Learning-based Multimedia Lab. The SoC Design and Test Lab focuses on developing methodologies, algorithms, techniques, and tools for validating, verifying, testing, and analyzing system-on-chip (SoC) and 3D devices. The Learning-Based Multimedia (LBMM) Group has wide interests in various algorithms and techniques for multimedia applications, but its current focus is Mobile Computer Vision: addressing the main challenges for achieving the required real-time performance of vision tasks in a mobile, embedded environment, including designing a new energy-efficient parallel architecture for vision tasks.


PhD: Electrical Engineering & Computer Sciences, UC Berkeley (1988)


Tim Cheng worked at Bell Laboratories in Murray Hill, NJ, from 1988 to 1993 and joined the faculty at UC Santa Barbara in 1993 where he is currently a Professor of Electrical and Computer Engineering. He was the Founding Director (1999-2002) of UCSB's Computer Engineering program and former Chair (2005-2008) of the ECE Department. He has published over 300 technical papers, co-authored five books and holds 11 U.S. Patents. He currently serves as Editor-in-Chief for IEEE Design and Test of Computers, Editor of IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Associate Editor for ACM Transactions on Design Automation of Electronic Systems, Associate Editor for Formal Methods in System Design, Editor for Journal of Electronic Testing: Theory and Applications, and Editor for Foundations and Trends in Electronic Design Automation. He has served as general and program chair for numerous international conferences on design, and design automation and testing.